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Strain induced epitaxial relationships of Cr on Co/Pd(111) |
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| Authors: | S Boukari E Beaurepaire H Bulou B Carrire J P Deville F Scheurer R Baudoing-Savois M De Santis |
| Institution: | a Institut de Physique et Chimie des Matériaux de Strasbourg, U.M.R. 7504 CNRS-Université Louis Pasteur 23 rue du Loess, 67037, Strasbourg Cedex, France b Laboratoire de Cristallographie, 25 av. des Martyrs, CNRS-INPG-Université J. Fourier, 38042, Grenoble Cedex, France |
| Abstract: | The growth and structure of Co ultra-thin films on Pd(111) and Cr on Co/Pd(111) have been analyzed by grazing incidence X-ray diffraction and low energy electron diffraction. It is shown that the in-plane lattice constant of the epitaxial Co film depends on the growth temperature. Although the strain decreases as a function of the Co film thickness, it persists for 20 monolayer (ML) films or even thicker. When Cr is deposited at room temperature on a strained Co film (10 to 20 ML thick) a Kurdjumov–Sachs epitaxial relationship is observed, whereas when Cr is deposited on a Co(0001) single-crystal or on a very thick Co film on Pd(111), a Nishyama–Wassermann orientation is obtained. |
| Keywords: | Chromium Cobalt Epitaxy Low energy electron diffraction Magnetic thin films Palladium X-ray diffraction |
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