Evolution of surface width in electrochemical nucleation and growth |
| |
| Authors: | Lian Guo Peter C. Searson |
| |
| Affiliation: | Department of Materials Science and Engineering, Johns Hopkins University, Baltimore MD 21218, United States |
| |
| Abstract: | The evolution of surface width during growth of copper islands is studied in the kinetic regime, allowing control of island shape as well as island density. We show that film roughness at island coalescence is determined by island density, island shape, and the island growth kinetics. The connection between the kinetics of island growth and film growth provides the scientific basis for control of surface roughness. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
