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X-Ray Tube Voltage Dependence of Wiener Spectra of Screen Structure Mottle Recorded on Front and Back Emulsions
Authors:Hidetaka Arimura  Takaharu Ikeda  Takeshi Ikari  Hideaki Kubota  Masao Matsumoto  Atsushi Takigawa  Nobuyuki Nakamori  Hitoshi Kanamori
Affiliation:(1) Shimadzu Corporation, Nakagyo-ku, Kyoto 604, Japan;(2) Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606, Japan;(3) Information Processing Center, Shiga University, Hikone 522, Japan;(4) Faculty of Medicine, Osaka University, Toyonaka 560, Japan
Abstract:A low-speed screen/film system was used to investigate structure mottle, i.e., the density fluctuation of an x-ray film due to inhomogeneous screen structure. The tube voltage dependence of the Wiener spectra of the structure mottle was separately determined for front and back film emulsions. The Wiener spectral values of the structure mottle of the front emulsion were greater than those of the back emulsion at lower tube voltages. The spectral values of the structure mottle of the front emulsion decreased with tube voltage, while those of the back emulsion increased. We explain these phenomena by the behavior of the Wiener spectra of the relative spatial fluctuation of fluorescence intensity due to following reasons: (1) spatial thickness fluctuation of the screen produces a relative spatial fluctuation of x-ray energy absorbed in the screen, and (2) as the distance between the emulsion of the film and the average position of the x-ray absorption in the screen lengthens, the number of random scattering and absorption of light photons increase.Presented at the International Commission for Optics Topical Meeting, Kyoto, 1994.
Keywords:physical image quality  low-speed screen/film system  relative fluorescence fluctuation  screen structure mottle  tube voltage dependence
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