介绍一种测角装置的校准分析技术

本文所述的分析校准技术，可将测角装置校准到很高精度。校准时，使用了两台测角装置。并且利用该分析校准技术，分离了各误差曲线，采用该分析校准方法，无需预先知道任何一台测角装置的误差，而且测角装置可以是，也可以不是两台相同的装置。文中还确定了可以校准到高精度的测角装置的类型和校准配置。所采用的校准分析技术，可将角位置测试台和角度分解器校准到０．１角秒的精度。此方法已经用于校准轴角读出的双感应同步器系统。本文还提供了利用该分析校准方法获取的数据。

Introduction of an Analytical Technique for Calibrating Angular Measuring Devices

The analytical process described allows the calibration of angular measuring devices to reach very high accuracy. Two devices are used , and their error curves are separated in the process. No prior knowledgement of the each device's error is required and the devices may or may not be iden- tical. The types of device. which can be calibrated to high accuracy and the configuration for calibrating will be explored. The process has beep used to calibrate an angular positioning table and angle resolver to 0. 1 arc second. A dual inductosyn system for axis angle read - out has also been calibrated . Data acquired from these calihrations is presented.