Electron yield per ion charge-state correction for an ion collector with unsuppressed secondary electron emission |
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Authors: | J. Krása L. Láska M. P. Stöckli D. Fry |
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Affiliation: | (1) Institute of Physics, Acad. Sci. CR, Na Slovance 2, 182 21 Praha 8, Czech Republic;(2) J.R. Macdonald Laboratory, Department of Physics, Kansas State University, 66506 Manhattan, Kansas, USA |
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Abstract: | The electron yield per ion charge-state γ/q was measured for emission of electrons from clean polycrystalline gold induced due to impact of Ta q+ (11≤q≤41) ions with kinetic energy per chargeE i/q from 15 keV/q to 150 keV/q. The dependence of γ on angle of incidence was analyzed with use of relation γ(ϑ)=γ0 cos−f ϑ. The fitting of experimental data gives a range of γ0/q from 1 to 1.75 for Ta13+ and from 1.5 to 1.73 for Ta39+. The dependence of γ0/q onq andE i is discussed with respect to measurement of ion currents emitted from laser-produced plasmas with an ion collector with unsuppressed secondary electron emission. This work was supported by the Division of Chemical Sciences, Office of Basic Energy Sciences, Office of Energy Research, U.S. Department of Energy, and by grant A1010819 from the Grant Agency of the Academy of Sciences of the Czech Republic. |
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