Light-controlled microstrip line coupler

Conclusions We have analyzed coupling properties of the coupled microstrip lines whose substrate contain electron-hole plasma by means of the spectral domain method. Scattering parameters in each ports have been evaluated numerically as a function of plasma density.Experiments were carried out using high resistivity silicon and LEDs. The agreement of the theoretical and experimental results was satisfactory. The plasma density observed in the experiments is one-third as large as the theoretically estimated value.