Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods

Multiwave X-ray diffraction has been used to study the structure of crystalline samples. A cycle of local measurements of rocking curves (RCs) of the (220) and (371) reflections under conditions of multiwave diffraction (MD) has been carried out in a paratellurite crystal. The data obtained are used to compare the sensitivity to structure defects of two-beam diffraction with that of MD, which makes it possible to study the X-ray wave phase. The comparison has revealed a higher ability of the phase-sensitive method to detect defects.