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Measurements of charge transfer efficiency in a proton-irradiated swept charge device
Authors:WANG Yu-Sa  YANG Yan-Ji  CHEN Yong  LIU Xiao-Yan  CUI Wei-Wei  XU Yu-Peng  LI Cheng-Kui  LI Mao-Shun  HAN Da-Wei  CHEN Tian-Xiang  HUO Jia  WANG Juan  LI Wei  HU Wei  ZHANG Yi  LU Bo  YIN Guo-He  ZHU Yue  ZHANG Zi-Liang
Abstract:Charged Coupled Devices (CCDs) have been successfully used in several low energy X-ray astronomical satellites over the past two decades. Their high energy resolution and high spatial resolution make them a perfect tool for low energy astronomy, such as observing the formation of galaxy clusters and the environment around black holes. The Low Energy X-ray Telescope (LE) group is developing a Swept Charge Device (SCD) for the Hard X-ray Modulation Telescope (HXMT) satellite. A SCD is a special low energy X-ray CCD, which can be read out a thousand times faster than traditional CCDs, simultaneously keeping excellent energy resolution. A test method for measuring the charge transfer efficiency (CTE) of a prototype SCD has been set up. Studies of the charge transfer inefficiency (CTI) with a proton-irradiated SCD have been performed at a range of operating temperatures. The SCD is irradiated by 3×108cm-2 10 MeV protons.
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