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低维光电材料缺陷与界面增强拉曼散射
引用本文:侯翔宇,邱腾. 低维光电材料缺陷与界面增强拉曼散射[J]. 中国光学, 2021, 0(1): 170-181
作者姓名:侯翔宇  邱腾
作者单位:东南大学物理学院
基金项目:国家自然科学基金面上项目(No.11874108);国家重点研发计划项目(No.2017YFA0403600)。
摘    要:近年来,一系列新型低维光电材料相继涌现,展现出优异的性能.这些光电材料与表面增强拉曼散射(SERS)技术相结合,显示出巨大的应用潜力,有望成为高灵敏SERS活性基底.缺陷与界面调控是低维光电材料SERS应用的重要策略,本文将重点介绍新型低维光电材料缺陷与界面增强拉曼散射的种类和增强机理.通过对缺陷与界面增强拉曼散射的应...

关 键 词:缺陷  界面  表面增强拉曼散射  低维光电材料

Defects-and interface-enhanced Raman scattering in low-dimensional optoelectronic materials
HOU Xiang-yu,QIU Teng. Defects-and interface-enhanced Raman scattering in low-dimensional optoelectronic materials[J]. Chinese Optics, 2021, 0(1): 170-181
Authors:HOU Xiang-yu  QIU Teng
Affiliation:(School of Physics,Southeast University,Nanjing 211189,China)
Abstract:In recent years,a series of new low-dimensional optoelectronic materials with excellent properties have emerged.Combined with surface-enhanced Raman scattering(SERS)technology,they show great application potential and are expected to become highly sensitive SERS substrates.Defects and interface regulation of low-dimensional optoelectronic materials are important strategies for their applications in SERS technology.In this paper,the types and enhancement mechanisms of defects-and interface-enhanced Raman scattering in new low-dimensional optoelectronic materials are introduced.By looking forward to the application and research prospect of defects-and interface-enhanced Raman scattering,this work might inspire people to reconsider and further understand the study of SERS.
Keywords:defects  interface  surface-enhanced Raman scattering  low-dimensional optoelectronic materials
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