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Analysis of trace elements in trunk wood by thick-target PIXE using dry ashing for preconcentration
Authors:L. Harju  Jan-Olof Lill  Kjell-Erik Saarela  Sven-Johan Heselius  Fredrik Joachim Hernberg  Alf Lindroos
Affiliation:Department of Analytical Chemistry, ?bo Akademi University, FIN-20500 Turku, Finland, FI
Accelerator Laboratory, ?bo Akademi University, FIN-20500 Turku, Finland, FI
Department of Physics, ?bo Akademi University, FIN-20500 Turku, Finland, FI
Department of Geology and Mineralogy, ?bo Akademi University, FIN-20500 Turku, Finland, FI
Abstract:Thick-target Particle Induced X-ray Emission (TTPIXE) was used for the quantitative determination of trace-element concentrations in trunk wood. The wood samples were preconcentrated by dry ashing to improve the reliability of the sampling and the sensitivity of the analytical method. Samples of Scots pine (Pinus sylvestris) and Norway spruce (Picea abies) were collected from a polluted area (Harjavalta) as well as from a relatively nonpolluted area (Merimasku) in southwestern Finland. The elements studied were P, S, K, Ca, Mn, Fe, Ni, Cu, Pb, Rb, Sr, Ba, Cd and Ag. TTPIXE combined with dry ashing is a sensitive and reliable analytical technique for most elements studied. The method was validified by using several certified reference materials and also by ICP-MS analysis. Due to the low ash content (0.2–0.4%) in wood a high preconcentration factor can be obtained. Differences in trace-element uptake were observed between the two tree species studied. Trunk wood from the polluted area contained higher concentrations of heavy metal ions. Received: 30 August 1996 / Revised: 11 October 1996 / Accepted: 3 November 1996
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