HLSⅡ干涉法测量储存环横向尺寸与发射度

为了满足合肥光源升级改造后测量小束流尺寸的需求,设计了干涉法测量束团尺寸与发射度系统。简要介绍了在可见光波段利用干涉法测量束团横向尺寸的原理,详细介绍了该系统的光路与软硬件系统和图像处理算法。为了消除CCD的本底噪声对测量的影响,建立了本底噪声图像与束流流强的查找表,最终得到了多束团模式下的在线实验结果。测量得到的水平尺寸为265μm,测量误差为5.78μm;垂直尺寸为114μm,测量误差为4.89μm。

Beam transverse size and emittance measurement of HLS H using interferometry

With the purpose of measuring small beam size of HLS Ⅱ after upgrade, a beam transverse size and emittance measurement system of HLS Ⅱ has been developed. This paper introduces briefly the principle of measuring beam transverse size using interferometry in visible light. It illustrates in detail the software system, hardware system and the image processing algorithm of the measurement system. In order to eliminate the background noise of CCD, a lookup table between the background noise of CCD and the beam intensity has been established. In conclusion, the experiment results are presented at multi-bunch mode. The measured beam horizontal size is 265 m and the measurement error is 5.78 m, and the beam vertical size is 114 m and the measurement error is 4.89 m.