| Institution: | 1. Department of Electrical and Computer Engineering, Baylor University, Waco, TX 76798, United States;2. Departamento de Engenharia Electrotécnica, Instituto de Telecomunicacões, Universidade de Coimbra, 3030 Coimbra, Portugal;1. Institute of Nuclear Sciences Vinča, University of Belgrade, P.O. Box 522, 11001 Belgrade, Serbia;2. Faculty of Technology and Metallurgy, University of Belgrade, Karnegijeva 4, 11120 Belgrade, Serbia;1. Univ. Paris-Sud, Institut d’Electronique Fondamentale, UMR 8622, 91405 Orsay Cedex, France;2. CNRS, Orsay F-91405, France;3. Laboratoire Charles Fabry, IOGS, CNRS, Univ. Paris-Sud, 2 Ave A. Fresnel, 91127 Palaiseau Cedex, France;1. Department of Electrical and Computer Engineering, Aristotle University of Thessaloniki, GR-54124 Thessaloniki, Greece;2. School of Electronic and Computer Engineering, Technical University of Crete, GR-73100 Chania, Greece;1. College of Engineering, Osaka Institute of Technology, 5-16-1 Omiya, Asahi-ku, Osaka 535-8585, Japan;2. Graduate School of Science and Engineering, Yamaguchi University, 2-16-1 Tokiwadai, Ube 755-8611, Japan;3. Department of Chemistry and Materials Technology, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan;1. “Niccolò Cusano” University, Rome I-00166, Italy;2. “Roma Tre” University, Rome I-00146, Italy;1. Institute of Electronic Structure and Laser, Foundation for Research and Technology, Hellas (FORTH), P.O. Box 1385, Heraklion, Crete, Greece;2. Department of Materials Science and Technology, University of Crete, Greece;3. Physics Department, University of Crete, Greece;4. Ames Lab and Department of Physics and Astronomy, Iowa State University, Ames, IA, USA |
