| Offner成像光谱仪建模及像差分析 |
| |
| 引用本文： | 刘光宏,吴刚,凌青,王秋平,杜学维. Offner成像光谱仪建模及像差分析[J]. 光学学报, 2011, 0(3): 229-236 |
| |
| 作者姓名： | 刘光宏 吴刚 凌青 王秋平 杜学维 |
| |
| 作者单位： | 中国科学技术大学自动化系;中国科学技术大学国家同步辐射实验室; |
| |
| 基金项目： | 国家863计划(2010AA10Z201); 中国科学技术大学研究生创新基金(KD2007055)资助课题 |
| |
| 摘 要： | 利用光线追迹方法得到系统的数值模型,然后运用级数展开方法,建立起系统的3阶解析模型,亦即3阶像差理论.该模型给出系统像差系数和计算系统点列图的解析表达式,可适应于包含变间距凸面光栅的系统,并具有良好的扩展性.通过追迹示例Offner系统中10000条不同波长、不同高度的光线,结果表明运用解析模型可以快速而准确地生成系统...
|
| 关 键 词： | 光学设计 Offner成像光谱仪 光线追迹 像差分析 |
Modelling of Offner Imaging Spectrometers and Aberration Analysis |
| |
| Liu Guanghong Wu Gang Ling Qing Wang Qiuping Du Xuewei. Modelling of Offner Imaging Spectrometers and Aberration Analysis[J]. Acta Optica Sinica, 2011, 0(3): 229-236 |
| |
| Authors: | Liu Guanghong Wu Gang Ling Qing Wang Qiuping Du Xuewei |
| |
| Affiliation: | Liu Guanghong1 Wu Gang1 Ling Qing1 Wang Qiuping2 Du Xuewei2(1Department of Automation,University of Science and Technology of China,Hefei,Anhui 230027,China2National Synchrotron Radiation Laboratory,Anhui 230029,China) |
| |
| Abstract: | The ray-tracing method is applied to get the numerical model of the system,and then a series expansion method is used to establish a three-order analytical model.The analytical model provides analytical expressions of aberration coefficients and spot diagrams,adapts to the system containing a varied line spacing convex grating,and has strong scalability.The complete imaging performance can be quickly evaluated by the analytical expressions of spot diagrams.By tracking 10000 rays with different wavelengths a... |
| |
| Keywords: | optical design Offner imaging spectrometer ray tracing aberration analysis |
| 本文献已被 CNKI 等数据库收录！ |
