Jetlike component in sputtering of LiF induced by swift heavy ions |
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Authors: | Toulemonde M Assmann W Trautmann C Grüner F |
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Affiliation: | CIRIL, CEA-CNRS-ISMRA, BP 5133, 14070 Caen cedex 5, France. |
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Abstract: | Angular distributions of sputtered atoms from SiO2 and LiF single crystals were measured under the irradiation of 1 MeV/u swift heavy ions. In contrast to the almost isotropic distribution of SiO2, an additional jetlike component was observed for LiF. The total sputtering yield of SiO2 ( approximately 10(2) atoms/ion) can be reproduced by an extended inelastic thermal spike model, whereas the huge yield of LiF ( approximately 10(4) atoms/ion) needs a substantial decrease of the sublimation energy to be described by the model. |
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