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Preparation and femtosecond non-linear optical properties of Ag/SiO2 composite thin films |
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| Authors: | Ichiro Tanahashi Hideyuki Inouye Akihiro Mito |
| Affiliation: | 1. Department of Applied Chemistry, Faculty of Engineering, Osaka Institute of Technology, 5-16-1 Omiya, Asahi-ku, 535-8585, Osaka, Japan 2. Graduate School of Materials Science, Nara Institute of Science and Technology, 8916-5 Takayama-cho, Ikoma-shi, 630-0101, Nara, Japan 3. National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, 305-8563, Tsukuba, Ibaraki, Japan |
| Abstract: | Ag nanoparticles embedded in SiO2 thin films (Ag/SiO2 films) were prepared by a multitarget sputtering method. In the optical absorption spectra of the Ag/SiO2 films, the absorption peak due to the surface plasmon resonance (SPR) of Ag particle was clearly observed at the wavelength of 394–413 nm. The imaginary part of the third-order non-linear susceptibility, Im [χ(3)], of the Ag/SiO2 film was estimated to be ?1.1×10?8 esu measured by the femtosecond Z-scan technique near the SPR peak. The response time of the film measured from the decay of the differential transmission of the pump-probe experiment was 1.3 ps at the SPR peak. |
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