Effect of an electric field on defects in a nematic liquid crystal with variable surface anchoring |
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Authors: | T. Arun Kumar V.S.S. Sastry Ken Ishikawa Hideo Takezoe N.V. Madhusudana |
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Affiliation: | 1. School of Physics , University of Hyderabad , Hyderabad, 500046, India;2. Department of Organic and Polymeric Materials, , Tokyo Institute of Technology , 2-12-1-S8-42 O-okayama, Meguro-ku, Tokyo, 152-8552, Japan;3. Raman Research Institute , C.V. Raman Avenue, Bangalore, 560080, India |
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Abstract: | We report experimental studies on defects in a nematic liquid crystal with negative dielectric anisotropy mounted in a cell with perfluoropolymer-coated surfaces. The sample exhibits a discontinuous anchoring transition from planar to homeotropic on cooling at zero or a small electric field, and above a cross-over voltage a continuous ‘inverse Freedericksz transition’, at which the director starts tilting in opposite directions at the two surfaces. Defects of strength ±1/2 are either annihilated or expelled when the director tilts. On the other hand, disclination lines of ±1 which end in partial point defects (boojums) at the surfaces in the planar alignment regime acquire point defects of strength ±1 at the midplane of the cell when the director tilts. At a low enough temperature, the homeotropic anchoring becomes strong, and an electric field above the Freedericksz threshold generates the usual umbilic defects, which follow the dynamic scaling laws found in earlier studies. |
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Keywords: | defects surface anchoring annihilation boojums |
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