| Abstract: | A method combining wavelength sweep interferometry with the Fourior transform technique to perform the separate measurements of the physical thickness and the refractive index is proposed. By converting the optical path difference of the interferometer to the beat frequency of the interference signal we realize the depth scanning without mechanical moving parts. The effect of specimen dispersion is avoided by using a narrow tuning laser diode. For demonstrating this method we measure the physical thickness and the refractive index of an x cut LiNbO 3, BK9 and BK7 glass, and the results consist with the reported values. |
