Atomic force microscopy enabled roughness analysis of nanostructured poly (diaminonaphthalene) doped poly (vinyl alcohol) conducting polymer thin films |
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| Affiliation: | 1. International Center for New-Structured Materials (ICNSM), State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, People''s Republic of China;2. State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, People''s Republic of China;3. Key Laboratory of the Ministry of Education for Advanced Catalysis Materials, Institute of Physical Chemistry, Zhejiang Normal University, Jinhua 321004, People''s Republic of China;4. Laboratory of New-Structured Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People''s Republic of China;1. Shri A. N. Patel P. G. Institute of Science and Research, Anand 388001, Gujarat, India;2. P G. Department of Physics, Sardar Patel University, Vallabh Vidyanagar 388120, Gujarat, India;3. P G. Department of Applied and Interdisciplinary Sciences, CISST, Sardar Patel University, Vallabh Vidyanagar 388120, Gujarat, India;4. Department of Applied Physics, Polytechnic, The Maharaja Sayajirao University of Baroda, Vadodara 390002, Gujarat, India;1. Centre for Biosensors, Bioelectronics and Biodevices (C3Bio) and Department of Electronic and Department of Electronic and Electrical Engineering, University of Bath, Bath BA2 7AY, United Kingdom;2. School of Medical Science and Technology (SMST), Indian Institute of Technology Kharagpur, Kharagpur, West Bengal 721302, India;3. Institute of Chemistry, São Paulo State University (UNESP), Araraquara, São Paulo, Brazil |
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| Abstract: | The Atomic Force Microscopy (AFM) helps in evaluating parameters like amplitude or height parameters, functional or statistical parameters and spatial parameters which describe the surface topography or the roughness. In this paper, we have evaluated the roughness parameters for the native poly (vinyl alcohol) (PVA), monomer diaminonaphthalene (DAN) doped PVA, and poly (diaminonaphthalene) (PDAN) doped PVA films prepared in different solvents. In addition, distribution of heights, skewness and Kurtosis moments which describe surface asymmetry and flatness properties of a film were also determined. At the same time line profiles, 3D and 2D images of the surface structures at different scanning areas i.e. 5 × 5 μm2 and 10 × 10 μm2 were also investigated. From the roughness analysis and the surface skewness and coefficient of Kurtosis parameters, it was concluded that for PVA film the surface contains more peaks than valleys and the PDAN doped PVA film has more valleys than peaks. It was also found that the PDAN doped PVA film with acetonitrile solvent was used for substrate in electronics applications because the film gives less fractal morphology. Thus, the AFM analysis with different parameters suggested that the PDAN doped PVA films are smooth at the sub-nanometer scale. |
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| Keywords: | Atomic force microscopy Surface skewness Coefficient of kurtosis |
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