Structural and dielectric properties of phosphorous-doped PLZT ceramics |
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| Authors: | Puja Goel Subhash Sharma Kanhaiya Lal Yadav Ajit Ram James |
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| Institution: | (1) Smart Materials Research Laboratory, Department of Physics, Indian Institute of Technology, 247 667 Roorkee, India;(2) Defence Metallurgical Research Laboratory, Kanchanbagh, 500 058 Hyderabad, India |
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| Abstract: | In the present work we have reported the unique effects of P2O5-doped PLZT ceramics with composition (Pb0.92La0.08)(Zr0.65Ti0.35)O3 +x wt% of P2O5 (wherex = 1, 3 and 5) prepared chemically by co-precipitation method. X-ray diffraction studies suggest that the prepared compound
was very fine (10–25 nm), homogeneous and of rhombohedral symmetry. The apparent density of samples decreased with the P5+ additions. Studies of dielectric constant and dielectric loss as a function of frequency (10–1000 kHz) and temperature suggest
that the compound undergoes diffuse type of phase transition without any sign of relaxor behaviour. With increasingx, dielectric constant was found to decrease appreciably, whereas Curie temperature (TC) was found to increase |
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| Keywords: | Ceramics X-ray diffraction pyrochlore phase PLZT dielectric properties |
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