Measurements on high-bandwidth optical waveguides |
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| Authors: | D.B. Keck R. Bouillie |
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| Affiliation: | Corning Glass Works, Corning, N.Y., USA;Centre National d''Etudes des Telecommunications, Lannion, France |
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| Abstract: | Frequency response measurements on six high-bandwidth optical waveguides made by the doped deposited silica process are reported. One of these had an extrapolated bandwidth in excess of 3 GHz-km. From plane wave measurements the actual or optimum waveguide profile may be determined given the other. Data taken on a germanium borosilicate waveguide is in agreement with interference measurements. |
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