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High-resolution GaP Terahertz Spectrometer and Its Application to Detect Defects in Gamma-irradiated Glucose Crystal
Authors:Jun-ichi Nishizawa  Tetsuo Sasaki  Ken Suto  Masahiko Ito  Takashi Yoshida and Tadao Tanabe
Institution:(1) Semiconductor Research Institute, Aoba 519–1176, Aramaki, Aoba-ku, Sendai 980–0845, Japan;(2) Terahertz laboratory, Co.Ltd, Maedamen 50–1, Mitsumata, Komagata-cho, Yuzawa, Akita 012–0104, Japan;(3) Department of Material Science, Tohoku University, Aoba-yama 6–6–11–1021, Sendai 980–8579, Japan
Abstract:We developed high-resolution GaP THz signal generator using Cr:Forsterite lasers with gratings as both a pump and a signal beam for difference-frequency generation. A line width of less than 500 MHz and a wide tunable frequency range (0.6–6.2 THz) provide sufficient resolution for measuring materials with sharp absorption bands using the generator as the light source for a THz spectrometer. This is suitable for materials such as gases or solid samples at low temperatures. We demonstrated the detection of defects in organic materials, as they appear as slight deviations in the absorption frequency in the THz region.
Keywords:Terahertz wave  Spectroscopy  Defect  GaP  Cr:forsterite laser
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