一种集成电路测试流程分级动态调整方法

针对集成电路测试过程中测试时间长，影响测试效率的问题，提出了一种集成电路测试流程分级动态调整方法.通过统计样本集成电路中每种测试类型和每条测试向量的测试故障率来建立贝叶斯概率模型，根据其命中故障点的概率高低分级调整它们的加载顺序.随着测试的进行，不断收集测试数据，动态更新测试类型和测试向量的测试故障率，同步调整测试类型以及测试向量的加载顺序.实验表明，使用动态调整后的测试流程可以更早的发现故障电路，显著减少故障电路的测试时间，提高测试效率.本算法是完全基于软件的，不需要增加硬件开销，可以相容于传统的集成电路测试流程.

Hierarchical Dynamic Adjustment Method for Integrated Circuit Testing Process

Aiming at the problem of long test time and affecting test efficiency in integrated circuit testing process,a hierarchical dynamic adjustment method for integrated circuit testing process was proposed.The Bayesian probability model was established by counting the test failure rate of each test type and each test vector in the sample integrated circuit,and the testing process is hierarchically adjusted according to the probability of their hit fault.With the test progressed,the test data was collected continuously,the test failure rate of test type and vector were updated dynamically,and their loading order was adjusted synchronously.The experimental results showed that the proposed method could significantly reduce test time and improve test efficiency.Furthermore,the proposed algorithm is completely based on software,no additional hardware overhead,and can be compatible with the traditional integrated circuit testing process.