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Determination of lattice parameters and thermal expansion of CuGe2P3 + 0.2 Ge3P4 at elevated temperatures
Authors:G Bhikshamaiah  S Annapurna  A K Singh
Abstract:CuGe2P3 is a p‐type semiconductor with zincblende structure. Ge3P4 is soluble up to 35 mole% in CuGe2P3. Lattice parameters of CuGe2P3 + 0.2 Ge3P4 have been determined at elevated temperatures from room temperature to 873 K using the x‐ray diffraction profiles (111), (200), (220), (311), (222), (400), (331), (420), (422) and (511) obtained from high temperature diffractometer. It is found that the lattice parameter increases linearly from 0.53856 nm at RT to 0.54025 nm at 873 K. The data on lattice parameter is used and coefficient of lattice thermal expansion of CuGe2P3 +0.2 Ge3P4 was determined at different temperatures. It is found that the coefficient of thermal expansion of CuGe2P3 +0.2 Ge3P4 is 5.48 x 10‐6 K‐1 and is independent of temperature. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Keywords:semiconductor  x‐ray diffraction  lattice parameter  thermal expansion
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