Structural study of lanthanum nickelate thin films deposited on different single crystal substrates |
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Authors: | Vincent Faucheux |
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Affiliation: | LMGP-ENSPG-INPG, INPG-CNRS, UMR 5628, BP 46, FR-38402 Saint Martin d’Hères, Cedex, France |
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Abstract: | Fabrications of La2NiO4+δ thin film layers by liquid-injection metalorganic chemical vapor deposition were tried on different single crystals substrates: (001)Si, (001)MgO, (001)LaAlO3 and (001)SrTiO3. As results of structural characterizations, polycrystalline dendritic layers of La2NiO4+δ tetragonal (or orthorhombic) phase were observed on (001)Si substrates while layers of a perovskite-like cubic structure were observed on the other single crystal substrates. From a high-resolution TEM study of a layer deposited on (001)MgO, such a perovskite-like cubic structure exhibits many planar structural faults likely similar to planes of oxygen vacancies of the La2NiO4+δ orthorhombic structure. A thin intermediate epitaxial layer of NiO phase was also identified. Using a X-ray texture diffractometer, the layer structure on (001)MgO, (001)LaAlO3 and (001)SrTiO3 was confirmed to be of cubic structure with 〈100〉 axes parallel to those of the substrate. The T dependence of the resistivity of a layer deposited on (001)MgO substrate was found to be of a semi-conducting behavior. |
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Keywords: | Ruddlesden-Popper oxide Metalorganic chemical vapor deposition Transmission electron microscopy X-ray diffraction |
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