首页 | 本学科首页   官方微博 | 高级检索  
     检索      

PEEM/LEEM技术在两维原子晶体表面物理化学研究中的应用
引用本文:宁艳晓,傅强,包信和.PEEM/LEEM技术在两维原子晶体表面物理化学研究中的应用[J].物理化学学报,2016,32(1):171-182.
作者姓名:宁艳晓  傅强  包信和
作者单位:
基金项目:the National Natural Science Foundation of China(21573224, 21222305, 21373208, 21321002);Ministry of Science and Technology of China(2013CB933100, 2013CB834603)
摘    要:光发射电子显微镜(PEEM)/低能电子显微镜(LEEM)技术能够原位实时对表面结构、表面电子态和表面化学进行动态成像研究,在催化、能源、纳米、材料等领域有着重要的应用。本文着重介绍这两种技术的新进展,以及该技术在两维原子晶体的表面物理化学研究中的应用;包括原位研究两维原子晶体(石墨烯、氮化硼等)的生长、异质结构的形成、两维原子晶体表面下的插层反应和限域催化反应;将表面原位成像、微区低能电子衍射(μ-LEED)、图像亮度随电子束能量变化(I-V)曲线研究与其它表面表征技术相结合,能够有效理解两维层状材料表面以及层状材料与衬底界面上的动态过程。

关 键 词:光发射电子显微镜  低能电子显微镜  二维原子晶体  石墨烯  界面反应  催化  
收稿时间:2015-10-25

Applications of PEEM/LEEM in Dynamic Studies of Surface Physics and Chemistry of Two-Dimensional Atomic Crystals
Yan-Xiao NING,Qiang FU,Xin-He BAO.Applications of PEEM/LEEM in Dynamic Studies of Surface Physics and Chemistry of Two-Dimensional Atomic Crystals[J].Acta Physico-Chimica Sinica,2016,32(1):171-182.
Authors:Yan-Xiao NING  Qiang FU  Xin-He BAO
Institution:
Abstract:Photoemission electron microscopy (PEEM)/low energy electron microscopy (LEEM) are surface techniques that can be used to image surface structure, electronic states, and surface chemistry. Important applications of the technique in catalysis, energy, nano science, and material sciences have been seen. In this paper, we briefly introduce the principle of PEEM/LEEM and the recent advances of the technique. Then, some applications of PEEM/LEEM in dynamic studies of surface physics and chemistry of two-dimensional (2D) atomic crystals are highlighted, which include the growth of 2D atomic crystals, the formation of 2D heterostructures, the intercalation of the 2D materials, and chemical reactions confined under the 2D materials. Using surface imaging, micro-region low energy electron diffraction (μ-LEED), and the intensity–voltage (I–V) curves, the kinetics of 2D material growth and reactions at the 2D material/solid interfaces can be deeply understood.
Keywords:Photoemission electron microscopy  Low energy electron microscopy  Two-dimensionalatomic crystal  Graphene  Interface reaction  Catalysis  
本文献已被 CNKI 等数据库收录!
点击此处可从《物理化学学报》浏览原始摘要信息
点击此处可从《物理化学学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号