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Position magnifying sensor
Authors:K Matsuda  T H Barnes  B F Oreb and C J R Sheppard
Institution:

a Department of Physical Optics, School of Physics, University of Sydney, Sydney, NSW 2006, Australia

b Research Fellow, Japan Science and Technology, Kawaguchi Centre Building, 4-1-8 Honchyo, Kawaguchi-shi, Saitama-ken, Japan

c Department of Physics, University of Auckland, Private Bag 92019, Auckland, New Zealand

d CSIRO Telecommunications and Industrial Physics, Bradfield Road, West Lindfield, NSW 2070, Australia

Abstract:This paper describes the application of multiple beam shearing interferometry to a position magnifying sensor. A multiple beam shearing interferometer (MBSI) with a shear plate wedged in the vertical direction produces sharp multiple beam fringes. When the lateral displacement of a point source (which gives rise to the input beam of the MBSI) or its image occurs in the horizontal direction, these fringes move vertically in a magnified manner. This characteristic was used in a position magnifying sensor to detect the displacement of a point image. The advantages of the sensor include a large displacement magnification (more than a hundred times) and a large working distance.
Keywords:Position magnifying sensor  Multiple beam shearing interferometry  Position sensor  Shearing interferometry  Plane parallel plate  Shear plate
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