首页 | 本学科首页   官方微博 | 高级检索  
     检索      

HDI板爆板缺陷分析方法浅谈
引用本文:吴军球,荣国光.HDI板爆板缺陷分析方法浅谈[J].电子与封装,2013(2):41-44.
作者姓名:吴军球  荣国光
作者单位:上海交通大学微电子学院
摘    要:爆板是PCB制造企业中非常常见也非常严重的一种缺陷,随着后道无铅焊接制程的导入,该问题显得尤为突出,急待解决。作者根据实际工作经验,总结出了对HDI板爆板缺陷进行分析的4种不同分析方法:垂直金相切片分析法,平磨分析法,剥离分析法和Tg/T260测试分析法。通过对每种分析方法的详细介绍,总结出了其各自的优缺点和适用的场合。同时,通过对这些方法的介绍,为工程师在以后的工作中如何运用合适的方法对HDI板爆板缺陷进行全面有效的分析提供了参考。

关 键 词:HDI  爆板  分析方法

Introduction of HDI PCB Delamination Defects Analysis Method
WU Junqiu,RONG Guoguang.Introduction of HDI PCB Delamination Defects Analysis Method[J].Electronics & Packaging,2013(2):41-44.
Authors:WU Junqiu  RONG Guoguang
Institution:(School of Microelectronics,Shanghai Jiao Tong University,Shanghai 200240,China)
Abstract:Delamination is a normal but very critical defect/problem in PCB manufacture plant,this problem becomes more and more remarkable and needs to be solved as fast as possible with lead-free soldering applied in assembly process.Based on the author’s working practice,this paper introduced four different analysis methods for delamination defects of HDI PCB.Vertical cross-section analysis method with microscope,Flat polishing analysis method,Peeling off analysis method and Tg/T260 test method.It is a summary of the advantage,disadvantage and application of each method.It is also a guide how to use these methods to effectively analyze HDI PCB delamination defects in future.
Keywords:HDI  delamination  analysis method
本文献已被 CNKI 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号