Diffuse X-ray scattering study of the temperature variation of elastic constants in indium arsenide

The elastic constants of indium arsenide have been determined in the temperature range from 80 to 750 K on n-type samples with a carrier concentration of about 8 · 10¹⁷ cm⁻³ by Wooster's method from the measurements of the thermal X-ray diffuse scattering intensities. An average decrease in the elastic constants with increasing temperature over the above mentioned temperature range is found to be about 8%.