| Abstract: | The method of “induced growth striations” was applied to the hydrothermal growth of quartz crystals. Striations were due to a periodical modulation of the growth temperature induced and investigated by means of the X-ray Lang topography and plane wave reflection topography. The results show that the X-ray topographic methods are a sensitive tool for the characterization of the growth striations, which are produced generally by Al impurities. The application of the method of induced growth striations to quartz crystals and the characterization of these crystals with optical and X-ray topographical methods allow a deeper understanding of the crystal growth behaviour. |
