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具有势垒增强层的MSM光电探测器暗电流的计算
引用本文:覃化,史常忻.具有势垒增强层的MSM光电探测器暗电流的计算[J].固体电子学研究与进展,1998,18(2):176-180.
作者姓名:覃化  史常忻
作者单位:上海交通大学微电子技术研究所!200030
摘    要:将具有完全晶格匹配势垒增强层的MSM-PD简化为一维模型,并通过理论分析,得出了它的暗电流特性,进一步得到器件暗电流与势垒增强层的关系。

关 键 词:肖特基势垒  势垒增强层  暗电流特性  金属—半导体—金属光电探测器

Theoretical Calculation of the Dark Current in MSM-PD with a Barrier-enhancement Layer
Qin Hua, Shi Changxin, Wang Sengzhang.Theoretical Calculation of the Dark Current in MSM-PD with a Barrier-enhancement Layer[J].Research & Progress of Solid State Electronics,1998,18(2):176-180.
Authors:Qin Hua  Shi Changxin  Wang Sengzhang
Abstract:Metal-Semiconductor-Metal Photo-Detector (MSM-PD) with a lattice-matched barrier-enhancement layer is simulated by using an one-dimensionalmodel. The dark current characteristic and the relation of the dark current to theberrier-enhancement layer are derived theoretically.
Keywords:Schottky Barrier  Barrier-enhancement Layer  Dark Current Characteristic  Metal-Semiconductor-Metal Photo-Detector(MSM-PD)
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