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Mo掺杂SrBi4Ti4O15陶瓷的铁电介电性能
引用本文:金 灿,朱 骏,毛翔宇,何军辉,陈小兵.Mo掺杂SrBi4Ti4O15陶瓷的铁电介电性能[J].物理学报,2006,55(7):3716-3720.
作者姓名:金 灿  朱 骏  毛翔宇  何军辉  陈小兵
作者单位:扬州大学物理科学与技术学院,扬州 225002
基金项目:国家自然科学基金(批准号:10274066)资助的课题.
摘    要:用传统的固相烧结工艺,制备了钼掺杂铁电陶瓷样品SrBi4Ti4O15(SBTi)铁电陶瓷SrBi4-2x/3Ti4-xMoxO15(x=0.00,0.003,0.012,0.03,0.06,0.09).X射线衍射的结果表明,样品均为单一的层状钙钛矿结构相,Mo掺杂未改变SBTi的晶体结构.通过扫描电子显微镜观测发现,样品晶粒为片状,随掺杂量的增加,晶粒逐 关键词: 4Ti4O15')" href="#">SrBi4Ti4O15 Mo掺杂 剩余极化 居里温度

关 键 词:SrBi4Ti4O15  Mo掺杂  剩余极化  居里温度
文章编号:1000-3290/2006/55(07)/3716-05
收稿时间:12 29 2005 12:00AM
修稿时间:2005-12-292006-02-21

Ferroelectric and dielectric properties of Mo-doped SrBi4Ti4O15 ceramics
Jin Can,Zhu Jun,Mao Xiang-Yu,He Jun-Hui and Chen Xiao-Bing.Ferroelectric and dielectric properties of Mo-doped SrBi4Ti4O15 ceramics[J].Acta Physica Sinica,2006,55(7):3716-3720.
Authors:Jin Can  Zhu Jun  Mao Xiang-Yu  He Jun-Hui and Chen Xiao-Bing
Institution:College of Physics Science and Technology, Yangzhou University, Yangzhou 225002, China
Abstract:The ferroelectric ceramics samples of SrBi4-x/3Ti4-xMoxO15(x=0.00, 0.003, 0.012, 0.03, 0.06, 0.09) have been prepared by the conventional solid-state reaction method. X-ray diffraction analysis shows that the crystal structure of SrBi4Ti4O15 (SBTi) is not affected by Mo-doping. The scanning electronics microscope (SEM) images indicate that all the samples consist of sheet grains and the grain size is reduced by Mo-doping while the ferroelectric properties are improved significantly. The remanent polarization (2Pr) increases at first,then decreases with the increasing Mo content. At x=0.06, the 2Pr maximizes at a value of 26.5 μC/cm2, which about 117% higher in comparison with that of SBTi. And the coercive field of SBTi is increased only about 20%. The Curie temperature of the samples varied slightly after doping, which implies that the good thermal stability of SBTi is not sacrificed.
Keywords:SrBi4Ti4O15  Mo-doping  remanent polarization  Curie temperature
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