Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage |
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| Authors: | Manfred Schreiner Michael Melcher Katharina Uhlir |
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| Institution: | (1) Institute of Science and Technology in Art, Academy of Fine Arts, Schillerplatz 3, 1010 Vienna, Austria |
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| Abstract: | Scanning electron microscopy has been extensively used for the material characterization of objects of artistic and archaeological
importance, especially in combination with energy dispersive X-ray microanalysis (SEM/EDX). The advantages and limitations
of SEM/EDX are presented in a few case studies: analysis of pigments in cross-sections of paint layers, quantitative analysis
of archaeological glass from the Roman period excavated in Ephesos/Turkey, and investigations on glasses with medieval composition
concerning their weathering stability and degradation phenomena. |
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| Keywords: | Scanning electron microscopy (SEM) Energy dispersive analysis (EDX) Art analysis Pigment Glass Authentication Degradation Weathering |
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