首页 | 本学科首页   官方微博 | 高级检索  
     


Outdiffusion of deep electron traps in epitaxial GaAs
Authors:A. Mircea  A. Mitonneau  L. Hollan  A. Brière
Affiliation:(1) Laboratoire d'Electronique et de Physique Appliquée, F-94450 Limeil-Brévannes, France
Abstract:The annealing by outdiffusion of the “A-center” in GaAs (a deep electron trap, sometimes attributed to oxygen) has been studied quantitatively, and the diffusion coefficient determined as a function of temperature between 600 and 750 centigrade. Work supported in part by the Direction Générale de la Recherche Scientifique et Technique (D.G.R.S.T.)
Keywords:66  71.55
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号