X-ray and magnetic-field-enhanced change in physical characteristics of silicon crystals |
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| Authors: | V A Makara L P Steblenko A N Krit D V Kalinichenko A N Kurylyuk S N Naumenko |
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| Institution: | 1. Taras Shevchenko National University of Kyiv, ul. Volodimirska 60, Kyiv, 01601, Ukraine
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| Abstract: | The effect of low-energy (W = 8 keV) low-dose ((0.3?C7.3) × 102 Gy) radiation and a dc magnetic field (B = 0.17 T) on structural, micromechanical, and microplastic characteristics of silicon crystals has been studied. The features in the dynamic behavior of dislocations in silicon crystals, which manifest themselves upon only X-ray exposure and combined (X-ray and magnetic) exposure, have been revealed. |
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