Shock tube measurements of Y I and Y II oscillator strengths |
| |
| Institution: | 1. Hebei Key Lab of Optic-electronic Information and Materials, The College of Physics Science and Technology, Hebei University, Baoding 071002, China;2. Group for Materials Science and Applied Mathematics, Malmö University, Malmö, SE-20506, Sweden;3. Shanghai EBIT Lab, Key Laboratory of Nuclear Physics and Ion-beam Application, Institute of Modern Physics, Department of Nuclear Science and Technology, Fudan University, Shanghai 200433, China;4. School of Science, Hunan University of Technology, Zhuzhou, 412007, China;5. Department of Radiotherapy, Shanghai Changhai Hospital, Shanghai 200433, China;6. Institute of Applied Physics and Computational Mathematics, Beijing 100088, China |
| |
| Abstract: | Yttrium-silicon spectra have been photographed in the 3400- to 6200-Å region using a 3.4-m Ebert-type spectrograph. The light source was a helium-driven shock tube containing a mixture of powdered YSi2 in an Ar carrier gas. A high-speed mechanical shutter and a Garton-type coaxial flashtube were used to record essentially simultaneous emission and absorption spectra for each shock. This procedure resulted in the testing for and removal of a number of systematic errors during reduction of the data, yielding relative oscillator strengths for 255 Y I lines and 90 Y II lines. These relative oscillator strengths have been placed on an absolute scale using the published gf-values of Hannaford et al. and the 3906-Å line of Si I. A comparison of these results with those of previous workers shows general agreement, although significant differences are seen in several cases. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
