X-ray and IR analysis of Cu-Si ferrite

Polycrystalline soft ferrite, Cu_1+xSi_xFe_2−2xO₄ (x=0.0, 0.05, 0.1, 0.15, 0.2 and 0.3) were prepared by standard ceramic technique. The X-ray analysis confirmed the single phase formation of the samples up to x=0.1 beside a second phase for x?0.15. The lattice parameter was found to decrease with composition(x), which is attributed to ionic size difference of cations involved. The bulk density measurements shows two different behavior for x< >0.15. The IR spectra of Cu-Si ferrite system have been analyzed in the frequency range 200-1200 cm⁻¹. It revealed two prominent bands ν₁ and ν₂ which are assigned to tetrahedral and octahedral metal complexes, respectively. The position of the highest frequency band is around 575 cm⁻¹ while the lower frequency band is around 400 cm⁻¹.