Tracks of 18·56 MeV/u
40Ar ions in Lexan polycarbonate detector |
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| Authors: | Swarnali Ghosh Atul Saxena K K Dwivedi |
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| Institution: | (1) Department of Chemistry, North-Eastern Hill University, 793 003 Shillong, India |
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| Abstract: | Latent damage tracks of energetic40Ar ions (18·56 MeV/u) have been recorded in Lexan polycarbonate detector. Bulk and track-etch parameters are evaluated under successive chemical
etching. Our results show a linear correlation between the measured track-etch rate along the track and the corresponding
total energy-loss rate and predict a threshold value of 5·0 MeV mg−1 cm2 for track registration. Maximum etchable track lengths of40Ar ions as a function of energies have also been measured and compared with three different sets of theoretical ranges. |
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| Keywords: | Activation energy critical energy-loss rate Lexan track-etch rate track length |
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