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Si in-diffusion during the 3D islanding of Ge/Si(001) at high temperatures
Authors:J Walz  T Hesjedal  E Chilla  R Koch
Institution:(1) Kyoto University Venture Business Laboratory, Kyoto, 606-8501, Japan, JP;(2) Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai 980, Japan, JP;(3) OE group, LG Corporate Institute of Technology, 16 Woomyon-Dong, Seocho-Gu, Seoul, 137-140, Korea, KR
Abstract:Received: 7 September 1998 / Accepted: 20 November 1998 / Published online: 24 February 1999
Keywords:PACS: 78  20  Wc  78  45  +h  78  40  Fy
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