| 1300nm超辐射发光二极管寿命测试 |
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| 引用本文： | 孙孟相,谭满清,王鲁峰.1300nm超辐射发光二极管寿命测试[J].光学学报,2008,28(10):1994-1997. |
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| 作者姓名： | 孙孟相 谭满清 王鲁峰 |
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| 作者单位： | 中国科学院半导体研究所,北京,100083 |
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| 摘 要： | 作为光纤陀螺用光源的超辐射发光二极管(SLD)随着工作时间的延续,其性能会发生退化.采用加速老化的实验方法来估算InGaAsP SLD管芯的工作寿命.分别在环境温度373 K和358 K下对5只SLD管芯进行加速老化,并通过对P-t曲线拟合来推算和估计管芯的老化速率和激活能.计算出了器件的激活能平均值约为0.82 eV,SLD管芯在室温下的工作寿命超过106h,可以满足光纤陀螺用光源的寿命要求.对影响SLD管芯可靠性的因素以及管芯的退化机理进行了分析,为研制高可靠性的超辐射发光二极管提供了理论基础.
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| 关 键 词： | 光学器件 超辐射发光二极管 寿命 测试 激活能 |
| 收稿时间： | 2007/11/21 |
Lifetime Tests of 1300 nm Superluminesent Diodes |
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| Sun Mengxiang,Tan Manqing,Wang Lufeng.Lifetime Tests of 1300 nm Superluminesent Diodes[J].Acta Optica Sinica,2008,28(10):1994-1997. |
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| Authors: | Sun Mengxiang Tan Manqing Wang Lufeng |
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| Institution: | Institute of Semiconductors;Chinese Academy of Sciences;Beijing 100083;China |
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| Abstract: | Superluminescent diode(SLD) for the light source of fiber-optic gyroscope(FOG) will degrade along with the operating time elapse.Operating lifetime of fine SLDs has been estimated from the results of accelerated aging carried out for 3500 h at the ambient temperature of 373K and 358K respectively and the aging rate and active energy were estimated from power-time(P-t) curve fitting.The value of active energy is determined to be 0.82 eV and mean lifetime in practical operation at driving current of 100 mA an... |
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| Keywords: | optical device superluminescent (SLD) lifetime tests active energy |
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