Far infrared emission from plasma oscillations of Si inversion layers |
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| Authors: | D.C. Tsui E. Gornik R.A. Logan |
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| Affiliation: | Bell Laboratories, Murray Hill, NJ 07974, U.S.A. |
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| Abstract: | We observed narrow-band far infrared emission from Si-MOSFETs with metallic gratings fabricated on the optically semitransparent gate. The gate voltage dependence of the emission frequency, analyzed by a magnetic field tuned detector, shows that it results from radiative decay of the two-dimensional metallic grating. |
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