Fixed-frequency and threshold molecular photoelectron spectra of S 1s, Si 1s and Cl 1s core levels

Fixed-frequency and threshold photoelectron spectra have been recorded for ionization from the S ls shells in SF₆, CS₂ and COS, the Si 1s shells in SiH₄ and SiCl₄ and the Cl 1s shell in SiCl₄ using synchrotron radiation. Fixed-frequency spectra generally showed a single strong ionization feature with associated weak satellite structure due to excited ionized states. Threshold spectra closely resembled X-ray absorption spectra but with an additional feature due to direct ionization. In cases where resonant process enhanced the NEXAFS spectrum direct ionization was not observed.