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硅材料场致等效二阶极化率张量的研究
引用本文:刘秀环,陈占国,贾刚,张晓婷,张玉红.硅材料场致等效二阶极化率张量的研究[J].光学学报,2005,25(10):391-1395.
作者姓名:刘秀环  陈占国  贾刚  张晓婷  张玉红
作者单位:吉林大学电子科学与工程学院,长春,130023;吉林大学电子科学与工程学院,长春,130023;吉林大学电子科学与工程学院,长春,130023;吉林大学电子科学与工程学院,长春,130023;吉林大学电子科学与工程学院,长春,130023
基金项目:国家自然科学基金(60476027,60176009)资助项目.
摘    要:具有反演对称中心的硅单晶在电场作用下体内的反演对称中心消失,因而理论上应产生偶数阶非线性极化率。从理论上根据矢量与张量的作用,利用(eχf2f)=χ(3).E这一关系和张量变换理论系统地阐述了硅材料在内建电场或外加电场的作用下,具体在方向分别沿111]、110]和001]的电场作用下,得到的等效二阶极化率张量(eχf2f)分别与C3v、C2v和C4v点群的二阶极化率张量具有相同的形式,说明在物理性质方面,硅的对称性由Oh群在相应方向电场作用下分别被降低为C3v、C2v和C4v群,因此应该具有相应对称性晶体的二阶非线性光学性质;提出了电场E沿任意方向时硅的等效二阶极化率张量e(χf2f)的计算方法,对研究硅材料和其他具有反演对称中心材料的场致二阶非线性光学性质实验具有指导意义。

关 键 词:非线性光学  双光子响应  等效二阶极化率张量  倍频吸收  双光子吸收
文章编号:0253-2239(2005)00-1390-5
收稿时间:2004-12-14
修稿时间:2005-03-04

Research on Effective Second-Order Susceptibilities Induced by Electric Field Applied to Silicon
Liu Xiuhuan,Chen Zhanguo,Jia Gang,Zhang Xiaoting,Zhang Yuhong.Research on Effective Second-Order Susceptibilities Induced by Electric Field Applied to Silicon[J].Acta Optica Sinica,2005,25(10):391-1395.
Authors:Liu Xiuhuan  Chen Zhanguo  Jia Gang  Zhang Xiaoting  Zhang Yuhong
Abstract:Electric field applied to silicon, which is a kind of centrosymmetric materials, induces effective even-order nonlinear susceptibilities for silicon due to the vanishing of its inversion symmetry. The tensors of effective second-order susceptibilities of silicon are systematically studied according to the theories of χ(2)eff=χ(3)·E and tensor transformation when the directions of the applied electric fields or the built-in fields in the bulk of silicon crystal are along the crystal orientations of 111], 110] and 001], respectively. The results show that the forms of effective second-order susceptibilities agree with those of point groups of C3v, C2v and C4v, respectively, which indicates that silicon single crystal should belong to C3v, C2v or C4v group instead of Oh group under corresponding electric field, and thus, it should possess second-order nonlinear optical properties corresponding to related symmetric crystal. Also, a general deduction of χ(2)eff for silicon under an arbitrary applied electric field E is proposed, which can provide theoretical fundamentals for electric field-induced second-order nonlinear optical experiments of silicon and for those of other centrosymmetric materials.
Keywords:nonlinear optics  two-photon response  effective second-order susceptibility  doubled-frequency absorption  two-photon absorption
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