Thickness and angular dependence of the L‐edge X‐ray absorption of nickel thin films |
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| Authors: | Y Ufuktepe G Akgül F Aksoy D Nordlund |
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| Institution: | 1. Physics Department, University of Cukurova, , 01330 Adana, Turkey;2. Bor Vocational School, University of Nigde, , 51240 Nigde, Turkey;3. Physics Department, University of Nigde, , 51100 Nigde, Turkey;4. Stanford Synchrotron Radiation Laboratory, , MenloPark, CA 94025 USA |
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| Abstract: | We report on the near‐edge X‐ray absorption fine structure spectroscopy of the L3 (2p3/2) and L2 (2p1/2) edges for ferromagnetic pure nickel transition metal and show that the L2,3 edge peak intensity and satellite feature at ~6 eV above the L3 edge in nickel increase with increasing nickel film thickness both in the total electron yield and transmission modes. The absorption spectra of nickel metal, however, exhibit strong angular‐dependent effects when measured in total electron yield mode. In addition, we calculated the mean electron escape depth of the emitted electrons (λe), which was found for pure nickel metal to be λe=25 ± 2 Å. We point out the advantages of the total electron yield technique for the study of the L‐edge of 3d transition metals. Copyright © 2011 John Wiley & Sons, Ltd. |
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| Keywords: | NEXAFS nickel transmission yield 3d transition metals electron escape depth |
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