Examples of Quantification in XPS on 5f Materials |
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| Authors: | Thomas Gouder Ladislav Havela |
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| Institution: | (1) European Commission, Joint Research Centre, Institute for Transuranium Elements, Post Box 2340, D-76175 Karlsruhe, Germany, DE |
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| Abstract: | Various aspects of quantification in actinide research using photoelectron spectroscopy are discussed. In particular, the
influence of instrumental factors, different types of the background, and shape of the line intensities are addressed. We
give several examples of quantitative analysis of actinide bulk compounds and thin films. |
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| Keywords: | : XPS actinides thin layers |
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