Nanoscale inhomogeneities on the microchannel plate lead silicate glass surface |
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| Authors: | S. K. Kulov A. M. Karmokov O. A. Molokanov |
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| Affiliation: | (1) Department of Physics, University of Alberta, Edmonton, AB, Canada, T6G 2J1;(2) King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia;(3) Alakhawayn University, Ifrane, Morocco;(4) Present address: Department of Electrical Engineering, University of Calgary, Calgary, AB, Canada; |
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| Abstract: | The evolution of the surface morphology of S87-2 lead silicate glass after annealing under different conditions has been studied by atomic force microscopy. It is established that annealed leads to the formation of two levels of surface roughness, with heights of about 5 and 120 nm (the first and second levels, respectively). |
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