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光学非线性薄膜线性参数的快速测量与分析
引用本文:孙德贵 汪晓元. 光学非线性薄膜线性参数的快速测量与分析[J]. 光子学报, 1995, 24(1): 57-61
作者姓名:孙德贵 汪晓元
作者单位:中国科学院长春光学精机械研究所应用光学国家重点实验室,东北电力学院基础部
摘    要:本文提出了-种光学非线性薄膜线性参数的方便有效的测量方法,测量了ZnSe非晶态光学薄膜的线性折射率和消光系数。在此方法中,实验数据的计算与处理由-套计算机软件来完成。最后,文章对测量精度进行了简单的讨论。

关 键 词:光学薄膜  线性参数  快速测量
收稿时间:1994-12-04

FAST MEASUREMENT AND ANALYzATION FOR THE LINEARr PARAMETERS OF NONLINEAR OPTICALTHIN-FILM
Sun Degui,Wang Xiaoytian,Weng Zhaoheng State Key Laboratory of Applies Optics,Changchun Instititle of Optics and Fine Mechanics,Academia Sinica,chang chun )Basic Course Minislry,Northeast Institute of Electrical Power,Jilin. FAST MEASUREMENT AND ANALYzATION FOR THE LINEARr PARAMETERS OF NONLINEAR OPTICALTHIN-FILM[J]. Acta Photonica Sinica, 1995, 24(1): 57-61
Authors:Sun Degui  Wang Xiaoytian  Weng Zhaoheng State Key Laboratory of Applies Optics  Changchun Instititle of Optics  Fine Mechanics  Academia Sinica  chang chun )Basic Course Minislry  Northeast Institute of Electrical Power  Jilin
Affiliation:Sun Degui,Wang Xiaoytian,Weng Zhaoheng State Key Laboratory of Applies Optics,Changchun Instititle of Optics and Fine Mechanics,Academia Sinica,chang chun 130022)Basic Course Minislry,Northeast Institute of Electrical Power,Jilin 132012
Abstract:In this paper,a convenient and effective method for measuring the linear parameters of nonlinear optical thin-film is proposed and the linear refraction and extinct of optical thin-film of ZnSe are measured,In this metho d,calculating and processing for experimental data are completed by a set of computer software. Finally,the measuryng accuracy is briefly discussed.
Keywords:Thin film  Linear parameter  Fast measurement
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