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a-SiC:H薄膜的中子辐照研究
引用本文:刘贵昂,谢二庆,王天民. a-SiC:H薄膜的中子辐照研究[J]. 强激光与粒子束, 2003, 15(3): 271-274
作者姓名:刘贵昂  谢二庆  王天民
作者单位:1.湛江海洋大学 理学院,广东 湛江 524088;2.兰州大学 物理系,甘肃 兰州 730000; 3.北京航空航天大学 理学院,北京 100083
基金项目:航空项目基金资助课题(98G51124)
摘    要: 用射频(13.56MHz)反应溅射法制备了a-SiC:H 薄膜,并将制得的薄膜采用高能中子(14MeV)进行辐照。采用电阻率、Raman谱及红外光谱对薄膜的结构与特性变化规律进行了表征。分析结果表明:所得a-SiC:H薄膜中存在多余的非晶态碳。随着中子辐照剂量的增加,a-SiC:H薄膜中SP-2C=C键增加,即其中的碳存在类石墨化的趋势。中子辐照后薄膜的电阻率的略微减小现象,可用缺陷对载流子的捕获模型进行解释。

关 键 词:a-SiC:H薄膜  中子辐照  非晶碳  石墨化
文章编号:1001-4322(2003)03-0271-04
收稿时间:2002-09-23
修稿时间:2002-09-23

Irradiation effect of neutrons on a-SiC:H films
liu gui-ang,xie er-qing,wang tian-min. Irradiation effect of neutrons on a-SiC:H films[J]. High Power Laser and Particle Beams, 2003, 15(3): 271-274
Authors:liu gui-ang  xie er-qing  wang tian-min
Affiliation:1.College of Science,Zhanjiang Ocean University, Zhanjiang 524088, China;2. Department of Physics, Lanzhou University, Lanzhou 730000,China;3. Beijing University of Aeronautics and Astronautics, Beijing 100083,China
Abstract:Amorphous hydrogenated silicon carbide (a-SiC:H) films were prepared by the reactive sputtering method, which were irradiated by high energy neutrons. Using resistivity, Raman scattering, and infrared transmission spectroscopy, the authors investigated the neutrons irradiation effect on the structure and properties of a-SiC:H films. There were superfluous carbon in the films. It is found that the increase of irradiation does results in the increase of SP2C=C bonds in a-SiC:H films, i.e. the carbons in the films tended to graphitization. In general, the graphitization of carbon led to the decrease of resistivity sharply, but the decrease of resistivity in this paper was smooth. The phenomenon can be interpreted according to the model that the carriers were trapped by the defects.
Keywords:a-SiC:H films  Neutrons irradiation  Amorphous carbons  Graphitization
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