Planar laser-induced fluorescence (PLIF) measurements of liquid film thickness in annular flow. Part II: Analysis and comparison to models |
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| Authors: | D. Schubring T.A. Shedd E.T. Hurlburt |
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| Affiliation: | 1. Visualization, Imaging, and Computation of Thermohydraulics for Reactors (VICTR) Lab, University of Florida, 202 Nuclear Science Building, P.O. Box 118300, Gainesville, FL 32611-8300, USA;2. Multiphase Flow Visualization and Analysis Laboratory (MFVAL), University of Wisconsin-Madison, 1500 Engineering Drive, Madison, WI 53706-1609, USA;3. Bettis Laboratory West Mifflin, PA 15122, USA |
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| Abstract: | Film thickness distributions in upward vertical air–water annular flow have been determined using planar laser-induced fluorescence (PLIF). Film thickness data are frequently used to estimate interfacial shear and pressure loss. This film roughness concept has been used in a number of models for annular flow of varying complexity. The PLIF data are presently applied to the single-zone interfacial shear correlation of Wallis; the more detailed model of Owen and Hewitt; and the two-zone (base film and waves) model of Hurlburt, Fore, and Bauer. For the present data, these models all under-predict the importance of increasing liquid flow on pressure loss and interfacial shear. Since high liquid flow rates in annular flow induce disturbance wave and entrainment activity, further modeling in these areas is advised. |
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| Keywords: | Film thickness Vertical flow Annular flow Fluorescence |
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