Electronic structure of SiO<Subscript>2</Subscript>: An X-ray emission spectroscopic and density functional theoretical study期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Electronic structure of SiO2: An X-ray emission spectroscopic and density functional theoretical study

Authors:	T. N. Danilenko M. M. Tatevosyan V. G. Vlasenko

Abstract:	The electronic structure of SiO₂ is investigated by means of valence to core X-ray emission spectroscopy and quantum-mechanical calculations in the density functional theory approximation. Analysis of a complete set of SiK_α1, SiL_{2, 3}, and OKα X-ray emission and XPS spectra along with the calculated data provides comprehensive information on chemical interactions that occur in SiO₂.

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