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High-vacuum tip enhanced Raman spectroscopy |
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| Authors: | Zheng-Long Zhang Li Chen Shao-Xiang Sheng Meng-Tao Sun Hai-Rong Zheng Ke-Qiu Chen Hong-Xing Xu |
| Affiliation: | 1. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P. O. Box 603-146, Beijing 100190, China; 2. Department of Applied Physics, Hunan University, Changsha 410082, China; 3. School of Physics and Information Technology, Shaanxi Normal University, Xi’an 710062, China |
| Abstract: | Tip-enhanced Raman spectroscopy (TERS) is high-sensitivity and high spatial-resolution optical analytical technique with nanoscale resolution beyond the diffraction limit. It is also one of the most recent advances in nanoscale chemical analysis. This review provides an overview of the state-of-art inTERS, in-depth information about the different available types of instruments including their (dis)advantages and capabilities. Finally, an overview about recent development in High-Vacuum TERS is given and some challenges are raised. |
| Keywords: | surface enhanced Raman scattering （SERS） tip enhanced Raman scattering （TERS） high vacuum |
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